XOS® has been a leading global provider of advanced X-ray optics for material analysis systems since the optics’ commercial introduction in the mid-1990s. The systems are important for essentially all industries that use materials — from cement to semiconductor to pharmaceutical to petroleum — measuring aspects such as semiconductor film thickness, stress in turbine blades, groundwater contamination, and contaminant levels.
Advanced X-ray optics can often increase the sensitivity of the measurements by more than a factor of 100, while decreasing the measurement time, increasing spatial resolution, and decreasing the size and cost of the equipment.
XOS has established its national and international presence by partnering with well-established manufacturers; and also through established distribution partners who are the most experienced and respected in the relevant markets. Using this strategy, XOS has penetrated the most important international markets, and the most respected companies in Europe and Asia, to become a dominant supplier of this technology in the world.
David Morris, ICSPI
David Morris of ICSPI highlights the Redux AFM's ease of use, enhancing AFM accessibility for nanoscale imaging.
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
This product profile describes the features and applications of the 2030PV PRO™ microspectrophotometer for measuring UV-visible-NIR range transmission.
The BM-10 Bench Top Vibration Isolation Platform from Minus K is only 4.6 inches tall and 12 inches wide and deep yet can provide extreme performance.
The NanoWizard ULTRA Speed 3 BioAFM by Bruker combines advanced optical microscopy and super-resolution techniques to provide correlated sample measurements and in-depth nanomechanical characterization.