Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation in the spatial resolution. Integration of both techniques overcomes this gap. On the webinar we will discuss the basics of technology, as well as the advanced features provided by the deep integration of AFM & Raman. Recent results published in prestigious scientific journals will be discussed.
NT‑MDT SI was the first company to introduce the commercially available AFM-Raman system in 1998. Since then, NT‑MDT SI has been a world leader in integrated solutions for AFM-Raman and TERS with more than 260 installations worldwide.