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Using SSRM to Characterize a Li Ion Battery Electrode

Using SSRM to Characterize a Li Ion Battery Electrode

PinPoint™ SSRM enhances LIB electrode analysis, providing high-quality mechanical and electrical property data in a high vacuum environment.

From Park Systems 14 Jul 2020

C-AFM for Current Distribution Mapping of Carbon Nanotube-Embedded Polymer

C-AFM for Current Distribution Mapping of Carbon Nanotube-Embedded Polymer

C-AFM reveals nanoscale conductivity in CNT-embedded polymers, aiding the optimization of photovoltaic and semiconductor devices.

From Park Systems 14 Jul 2020

Polymer Thin Films: High Resolution Phase Imaging

Polymer Thin Films: High Resolution Phase Imaging

AFM phase imaging reveals nanoscale changes in polymer thin films post-heating and bias, offering insights into fibril orientation for material design.

From Park Systems 21 Jan 2021

Utilizing Park System's SECCM for Nanoscale Electrochemical Studies

Utilizing Park System's SECCM for Nanoscale Electrochemical Studies

SECCM offers high-resolution mapping of nanoscale electroactivity, ideal for studying energy storage and electrocatalysis at the electrode interface.

From Park Systems 29 Jan 2021

Dual Frequency Resonance Tracking: Stabilizing the Piezoresponse

Dual Frequency Resonance Tracking: Stabilizing the Piezoresponse

Dual resonance frequency tracking enhances PFM, enabling precise imaging of ferroelectric domains with minimal topographic crosstalk.

From Park Systems 21 Jan 2021

SSRM and SCM for Carrier Profiling in a High Vacuum

SSRM and SCM for Carrier Profiling in a High Vacuum

SSRM and SCM offer high-resolution 2D carrier profiling for microelectronics, with the Park NX-Hivac AFM providing precise measurements in sub-10 nm devices.

From Park Systems 14 Jul 2020

Superlattice Electromechanical Characterization with Piezo-Response Force Microscopy

Superlattice Electromechanical Characterization with Piezo-Response Force Microscopy

Characterizing Moiré superlattice periodicity in graphene/hBN structures using contact resonance PFM reveals precise lattice misalignments.

From Park Systems 29 Apr 2021

Park FX40: The Story Behind Designing a New Class of the Automatic Atomic Force Microscope (AFM)

Park FX40: The Story Behind Designing a New Class of the Automatic Atomic Force Microscope (AFM)

Park Systems unveils the FX40, a next-gen automated AFM, enhancing user convenience with full automation, machine learning, and improved performance.

From Park Systems 2 Sep 2021

Atomic Force Microscopy (AFM): A Comparison of AM KPFM and Sideband KPFM

Atomic Force Microscopy (AFM): A Comparison of AM KPFM and Sideband KPFM

Sideband KPFM outperforms AM-KPFM in spatial resolution and sensitivity for nanoscale surface potential and work function mapping.

From Park Systems 20 Jan 2021

Automatic Atomic Force Microscopy (AFM) with the FX40

Automatic Atomic Force Microscopy (AFM) with the FX40

Park FX40, an autonomous AFM, revolutionizes nano-metrology with automated setup, scanning, and intelligent features for high-quality data.

From Park Systems 9 Aug 2021

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