Posted in | Atomic Force Microscopes

Sample Scanning with the TT-AFM from AFM Workshop

This video (Part 3 of 3) provides a demonstration of the TT-AFM from AFM Workshop. It shows the entire process from loading a sample to obtaining results.

The process involves the following steps:

  • Loading the sample
  • Loading the cantilever
  • Aligning the laser
  • scanner calibration
  • Tip approach
  • Setting scan parameters
  • Sample scanning
  • Refining scan parameters

Run time - 2:22min

AFM Workshop Intro 3 of 3

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