Rudolph Technologies provides process characterization solutions and applications support for semiconductor manufacturers around the world. The company's product portfolio for wafer processing customers includes high-performance metrology systems for opaque and transparent film measurement, sophisticated yield management software on a fabwide scale and automated macro defect inspection systems that can identify and analyze defects on all surfaces of a silicon wafer.
Products and technologies developed primarily for final manufacture and test include software products for defect analysis and review, high-speed macro defect inspection systems and probe card test and analysis solutions. With a strong history beginning in 1940, our strategy for continued technological and market leadership includes aggressive research and development, and dedicated applications support on a global scale.
Rudolph JetStep W2300 Advanced Packaging Lithography System Selected by Leading Taiwan-Based OSAT
Rudolph's F30 Inspection System Selected by Bosch for MEMS Device Fabrication Processes
Rudolph Technologies Receives Follow-On Order for Lithography and Inspection Systems
Major OSAT Manufacturer Selects Rudolph JetStep® Advanced Packaging Lithography System for Evaluation
Leading OSAT Facility Acquires Rudolph JetStep® Advanced Packaging Lithography System
Rudolph Receives Multi-System Orders for MetaPULSE G System to Measure Multilayer Films Simultaneously
SUNY CNSE Selects Rudolph's Discover Enterprise Yield Management Software for G450C Program
Rudolph Sells NSX 320 TSV Metrology System to CEA-Leti
Rudolph Receives $11 Million Order for Lithography Systems
Rudolph Reports Sale of First JetStep Photolithographic System for Semiconductor Packaging
Rudolph Introduces Thin Film Metrology System for Advanced Semiconductor Fabrication Applications
Packaging Lithography Company Rudolph to Participate in Needham Growth Conference
Rudolph’s Metrology System Offers Non-Destructive Measurements on Product Wafers
Rudolph Delivers Wafer Scanner and Macro Defect Inspection Systems to Semiconductor Manufacturer
Rudolph Technologies Ships 1000th Wafer-Level Packaging Inspection System
Rudolph Receives Multiple Orders for Latest Opaque Thin Film Metrology Tool
Rudolph Bags Order for NSX Wafer Inspection Systems from Avago Technologies
Rudolph Announces Expansion into LED Market with Two Significant Orders
Rudolph Technologies Announces Collaboration to Develop Integrated Wafer Inspection Systems
Rudolph Technologies Buys Certain Assets of Yield Dynamics Software Business
Rudolph’s NSX System Chosen for MEMS Processing by Fraunhofer ISIT
Rudolph Enhances Clients’ Wafer Test Performance by Adding New Capability to VX4 Platform
Rudolph Receives Multiple Orders for its Fab-Wide Process Analysis Software
Touch Micro-SystemTech Adds NSX with Discover Software to Dramatically Reduce Per-Wafer Inspection Time
Rudolph Technologies Receives Multiple Orders for Wafer Scanner and NSX Series Inspection Tools
Taiwan DRAM Manufacturer Orders All-Surface Inspection System for Front-End Manufacturing Process Control
Rudolph Technologies Joins SEMATECH's 3D Interconnect Program at UAlbany NanoCollege
Rudolph Technologies Receives Orders for WaferWoRx 300 from Major European Semiconductor Manufacturer
Professor Andre Nel
In this interview, AZoNano speaks with Professor Andre Nel about his involvement in innovative research describing the development of a 'glass bubble' nanocarrier that could help drug formulations access pancreatic cancer cells.
Jingang Li, Ph.D.
In this interview, AZoNano speaks with Jingang Li from the University of California, Berkley, who offers an introduction to the Nobel Prize-winning technology, Optical Tweezers.
Steve Kosier, Ph.D.
In this interview, we speak with SkyWater Technology about the current state of the semiconductor industry, how nanotechnology has helped to shape this sector, and their new partnership which aims to increase the accessibility of semiconductor chips for start-ups and research groups across the Unite
NMR spectroscopy is a characterization technique that is extensively used by chemical researchers.
Inoveno’s PE-550 is a best-selling electrospinning/spraying machine that can be used for the continuous production of nanofibers.
The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.