Applied NanoFluorescence, LLC was founded in Houston in 2004 by Professor R. Bruce Weisman of Rice University. Dr. Weisman serves as President. ANF's Chief Scientific Officer is Dr. Sergei M. Bachilo. Weisman and Bachilo are internationally recognized as the pioneering researchers who led the discovery and interpretation of fluorescence spectra from single-walled carbon nanotubes. The products offered by Applied NanoFluorescence embody these scientists' deep expertise in spectroscopic instrumentation and analysis.
Applied NanoFluorescence, LLC (ANF) manufactures and sells state-of-the art optical instruments to detect, characterize, and quantify nanomaterials, especially single-walled carbon nanotubes (SWCNT) and other near-infrared fluorophores in bulk samples (e.g. Ag2S and PbS quantum dots). Our analyzers offer the highest sensitivity available plus sophisticated software that automatically deduces and reports detailed sample compositions.
World's First Three-in-One Spectrometer for Carbon Nanotubes
Applied NanoFluorescence NS2 NanoSpectralyzer
David Morris, ICSPI
David Morris of ICSPI highlights the Redux AFM's ease of use, enhancing AFM accessibility for nanoscale imaging.
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
This product profile describes the features and applications of the 2030PV PRO™ microspectrophotometer for measuring UV-visible-NIR range transmission.
The BM-10 Bench Top Vibration Isolation Platform from Minus K is only 4.6 inches tall and 12 inches wide and deep yet can provide extreme performance.
The NanoWizard ULTRA Speed 3 BioAFM by Bruker combines advanced optical microscopy and super-resolution techniques to provide correlated sample measurements and in-depth nanomechanical characterization.