Insights from Industry
'Insights from Industry', a dynamic series of interviews at the cutting edge of the nanotechnology industry. Every interviewee is a leader in their particular field and is hand-picked to give an informative and accessible insight into their chosen field. These interviews are guaranteed to keep you in the know in a rapidly changing industry.
Ray Morgan, Director of Outreach, SEMI Americas, talks to AZoNano about startups, venture capitalists, and the upcoming Silicon Innovation Forum at SEMICON West 2015.
In this interview, Mario Peli talks to AZoNano about Allectra's new manufacturing facility in the UK, as well as the industry in general and some of the projects Allectra is working on.
In this interview, Michael Zapata III, Executive Chairman at Protochips Inc, talks to AZoNano about the next generation of in situ electron microscopy.
In this interview, Rainer Hillenbrand, Nanooptics Group leader at CIC nanoGUNE and co-founder of neaspec, talks to AZoNano about the incredible possibilities of nano-FTIR, which neaspec implements in their neaSNOM near-field microscope.
Adam Kollin, President of RHK Technology, talks to AZoNano about the features and benefits of the Low Temp PanScan.
In this interview, James Murray from MetNano talks about their unique, patented process for producing high quality silver colloids and nanoparticles, scalable to industrial volumes.
In this interview, Dr Curt Sander, founder and CEO of SPM manufacturer DME, talks to AZoNano about the origins of SPM technology, the beginnings of his company, and the future of the technique.
Bernd Runge, Vice President of OCSiAL, talks to AZonano about their single wall carbon nanotubes, called TUBALL™ and the benefits of their new partnership program.
In this interview, AZoNano spoke to Xenocs CEO Peter Høghøj and Executive Vice President Frédéric Bossan, about the revolutionary new instrument.
In this Insights from Industry interview, Benoît Dagon, CEO of Imina Technologies, talks to Will Soutter about their miBot range of manipulators for microscope sample characterization.