Insights from Industry
'Insights from Industry', a dynamic series of interviews at the cutting edge of the nanotechnology industry. Every interviewee is a leader in their particular field and is hand-picked to give an informative and accessible insight into their chosen field. These interviews are guaranteed to keep you in the know in a rapidly changing industry.
Mike Davies, International Sales and Applications Engineer at Micro Materials, talks to AZoNano about the NanoTest Xtreme and the benefits it offers user when performing indentation experiments under vacuum conditions.
We spoke to Markus Wimplinger, of the EV Group, about the new NIL center, the NILPhotonics™ Competence Centre, that the EV Group have recently opened and how they can guide manufacturers through the entire NIL process - from prototyping to developing a high volume manufacturing plan.
Warren Oliver, President of Nanomechanics talks to AZoNano about their range of revolutionizing Nanoindenters and Nanoindentation testing systems.
Dr. Neil Sarkar, President and Co-Founder of ICSPI and Duncan Strathearn, Director of Product Development at ICSPI talk to AZoNano about the world's first Mircroscopic Microscope, the new Single-Chip Atomic Force Microscope
Craig Wall, PhD, Director of Marketing, talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free LT AFM / STM and the high level performance it offers the SPM market.
Ray Morgan, Director of Outreach, SEMI Americas, talks to AZoNano about SEMICON West 2016.
FullScaleNANO are an emerging nanoanalysis start-up based in Florida. Their NanoMet software promises to automatically collect and collate vast amounts of accurate data from nanoscale images saving researchers from the time consuming (and often frustrating) task of manual measurement whilst removing human error from the equation.
Dr. Sang-Joon Cho, Director & Chief Scientist at Park Systems Corp., talks to AZoNano.com about the new SmartScan software and how it has removed the complicated operating systems typically associated with many AFMs.
Dr. Thomas Hartmann and Dr. Sascha Correll, of STOE, are experts in the field of x-ray crystalography. AZoNano spoke to both of them about STOE's new piece of equipment; the INSITU HT2, how it can be used for transmission geometry experiments and why this is great news for solid state scientists.
Thomas Mueller, Director of Development Applications in the AFM business unit of Bruker’s Nano Surfaces Division, talks to AZoNano.com about Bruker's Dimension FastScan AFM and the benefits of using bandwidth for faster, real time atomic force microscopy research.