Xenocs is a supplier of x-ray scattering equipment (SAXS/WAXS) for characterizing the nanostructure and morphology of materials at the nanoscale. Such equipment is used for the research, development, and production of advanced materials in various domains such as nanoparticles & colloïds, polymer, food science, cosmetics, or biostructural research.
Created in 2000 as a spin-off from Institute Laue Langevin, the company started activity offering its customers innovative X-ray sources, optics, and collimation solutions for X-ray characterization of nanomaterials and nanostructures.
Xenocs delivered its first x-ray scattering equipment in 2008, setting new standards for the possibilities of using SAXS in the laboratory for characterization at the nanoscale.
Working closely with both academic and corporate customers, Xenocs has continuously focused on providing value through performance and ease of use, while also creating a global sales and service organization.
In 2016, Xenocs bought Saxslab with operations in Denmark and in Massachusetts, making it the leading provider of SAXS equipment worldwide. Xenocs headquarters are located in France, and the company has subsidiaries in the USA, Denmark, and Singapore as well as a strong network of local contacts.
SAXS Measurements to Compare Lipid Nanoparticles With and Without RNA
Measuring Number Concentrations for Gold Nanoparticles
How to Characterize Protein Self-Association
SAXS Batch Data Analysis Reveals Particle Size Temporal Evolution
Measuring the Size Distribution of Nanoparticles in Powders, Dispersions and Composites
How to Study Fractal Structures and Single Particles at the Same Time
Operando Laboratory SAXS Experiments Can Help Study the Degradation of Catalysts
How to Obtain Traceable Number Concentration Measurements for Nanoparticles (NPs)
X-Ray Scattering Analysis of Polymer Nanocomposites
Size Distribution of Industrial Nanoparticles
Low Detection Limit of Polymer Crystallinity
Investigation of Surfactant Structure in Shampoo
Determining Polymer Crystallinity
Determining Phase Transformation Route
Small Angle X-Ray Scattering for Nanostructure Measurements
Xeuss 3.0 X-ray Scattering Beamline for Laboratory Applications
Smart Nanoscale Characterization with the Nano-inXider