? How much can the limit of #EDS analysis be pushed?
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Crude oil and natural gas are carried over long distances through #Steel pipelines. Steel pipelines suffer failure… https://t.co/TeyKRReW73
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This application note will brighten up your day! ?
Discover improvements to #EBSD for the characterisation of grai… https://t.co/9zWZ6KMqEr
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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems, their tools are used for R&D across a wide range of academic and industrial applications including:
Oxford Instruments NanoAnalysis technologies include:
Discriminating Phases with Similar Crystal Structures Using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectrometry (EDS)
Characterization of Through-Silicon Vias for 3D Integrated Chips with EBSD
Nanomanipulation and EBSD Analysis of Microelectronic Gold Wire
SEM Transmission Kikuchi Diffraction (TKD) Method Using EBSD Detector and AZtecHKL Software
Studying Distribution and Composition of Nanoscale Intermetallic Phases in a Nickel-Based Alloy
Simultaneous ESD and EBSD Analysis Using AZtec Large Area Mapping
All Oxide Solar Cell Characterization Using the LayerProbe
EBSD and EDS Characterization of High Entropy Alloys
Sample Preparation Techniques for EBSD Analysis (Electron Backscatter Diffraction)
Biological Energy-Dispersive X-Ray Spectroscopy (EDS) of Wheat Seed Using Large-Area Silicon Drift Detectors
Performing In Situ EDS in the TEM
Oxford Instruments NanoAnalysis Make Software Available Free for Home Use
Oxford Instruments Wins Queen’s Award for Enterprise 2019
Oxford Instruments Increases EBSD Speed by an Order of Magnitude
Oxford Instruments Launches its Next Generation Gunshot Residue Analysis System: AZtecGSR
Oxford Instruments Launches Innovative Product for SEM-Based Particle Analysis
Guest Expert Speakers Now Confirmed for ‘Bringing the Nanoworld Together 2014’: Oxford Instruments' 3rd Annual Seminars for the Nanotechnology Industry in India in November
Oxford Instruments Launch New Flagship Silicon Drift Detector for TEM
Oxford Instruments Announce New Sample Holder for TKD Microanalysis
Oxford Instruments X-Max Silicon Drift Detector Shortlisted for Prestigious MacRobert Award for Engineering
Oxford Instruments Nanoanalysis Announces Update to AZtec Microanalysis System
Oxford Instruments Launches LayerProbe Layer Thickness Measurement Option for FIBs and SEMs
Oxford Instruments Launch New Website
Oxford Instruments Launch Omniprobe 400 - Next Generation Nanomanipulator
Oxford Instruments Nanoanalysis Launches Groundbreaking Nanoanalysis Products at M&M 2012
Oxford Instruments launches new solution for EDS on TEM
Oxford Instruments Win Prestigious Prize for SEM X-Ray System
New Educational Website Dedicated to EBSD
Oxford Instruments Launch EBSD Detector Designed for Nanoscale Applications
Oxford Instruments Successfully Collaborate on Cutting Edge Nanotechnology Project
Oxford Instruments Install 1000th X-Max EDS Detector
Demonstration of 30 Second EDS Analysis Using AztecEnergy
Demonstration of EBSD Analysis Using AZtecHKL
Total Release Method for FIB Lift-Out from Omniprobe
The Ultim Extreme Silicon Drift Detector for EDS in the SEM
Symmetry: A High-Performance EBSD Detector Based on CMOS Technology
C-Nano: An EBSD Detector for High-Performance Entry into CMOS Technology
OmniProbe 400 Nanomanipulator
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Dr. Laurene Tetard
AZoNano speaks with Dr. Laurene Tetard from the University of Central Florida about her upcoming research into the development of nanotechnology that can detect animal-borne diseases. The hope is that such technology can be used to help rapidly control infected mosquito populations to protect public
Dr. Amir Sheikhi
AZoNano speaks with Dr. Amir Sheikhi from Pennsylvania State University about his research into creating a new group of nanomaterials designed to capture chemotherapy drugs before they impact healthy tissue, amending a fault traditionally associated with conventional nanoparticles.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.
Nikalyte’s NL-UHV is a state-of-the-art tool that allows the generation and deposition of nanoparticles in an Ultra-High vacuum onto a sample to create a functionalized surface.
The Filmetrics® F54-XY-200 is a thickness measurement tool created for automated sequence measurement. It is available in various wavelength configuration options, allowing compatibility with a range of film thickness measurement applications.