Oxford Instruments NanoAnalysis

Oxford Instruments NanoAnalysis

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems, their tools are used for R&D across a wide range of academic and industrial applications including:

  • Semiconductors
  • Renewable energy
  • Mining
  • Metallurgy
  • Forensics

Oxford Instruments NanoAnalysis technologies include:

  • Energy Dispersive/Wavelength Dispersive Microanalysis: Detectors, Electronics, Software
  • Electron Backscatter Diffraction: Software, Cameras
  • Microanalysis products
Discriminating Phases with Similar Crystal Structures Using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectrometry (EDS)

Discriminating Phases with Similar Crystal Structures Using Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-Ray Spectrometry (EDS)
Characterization of Through-Silicon Vias for 3D Integrated Chips with EBSD

Characterization of Through-Silicon Vias for 3D Integrated Chips with EBSD
Nanomanipulation and EBSD Analysis of Microelectronic Gold Wire

Nanomanipulation and EBSD Analysis of Microelectronic Gold Wire
SEM Transmission Kikuchi Diffraction (TKD) Method Using EBSD Detector and AZtecHKL Software

SEM Transmission Kikuchi Diffraction (TKD) Method Using EBSD Detector and AZtecHKL Software
Studying Distribution and Composition of Nanoscale Intermetallic Phases in a Nickel-Based Alloy

Studying Distribution and Composition of Nanoscale Intermetallic Phases in a Nickel-Based Alloy
Simultaneous ESD and EBSD Analysis Using AZtec Large Area Mapping

Simultaneous ESD and EBSD Analysis Using AZtec Large Area Mapping
All Oxide Solar Cell Characterization Using the LayerProbe

All Oxide Solar Cell Characterization Using the LayerProbe
EBSD and EDS Characterization of High Entropy Alloys

EBSD and EDS Characterization of High Entropy Alloys
Sample Preparation Techniques for EBSD Analysis (Electron Backscatter Diffraction)

Sample Preparation Techniques for EBSD Analysis (Electron Backscatter Diffraction)
Biological Energy-Dispersive X-Ray Spectroscopy (EDS) of Wheat Seed Using Large-Area Silicon Drift Detectors

Biological Energy-Dispersive X-Ray Spectroscopy (EDS) of Wheat Seed Using Large-Area Silicon Drift Detectors
Introduction to Particle Analysis via AZtecFeature

Introduction to Particle Analysis via AZtecFeature
Performing In Situ EDS in the TEM

Performing In Situ EDS in the TEM
Oxford Instruments Launches Unity – the World’s First Commercial Detector for Instant Chemical Imaging

Oxford Instruments Launches Unity – the World’s First Commercial Detector for Instant Chemical Imaging

Archived Oxford Instruments NanoAnalysis News

Demonstration of 30 Second EDS Analysis Using AztecEnergy

Demonstration of 30 Second EDS Analysis Using AztecEnergy
Total Release Method for FIB Lift-Out from Omniprobe

Total Release Method for FIB Lift-Out from Omniprobe
Revolutionizing Imaging With Unity

Revolutionizing Imaging With Unity
The Ultim Extreme Silicon Drift Detector for EDS in the SEM

The Ultim Extreme Silicon Drift Detector for EDS in the SEM
Symmetry: A High-Performance EBSD Detector Based on CMOS Technology

Symmetry: A High-Performance EBSD Detector Based on CMOS Technology
C-Nano: An EBSD Detector for High-Performance Entry into CMOS Technology

C-Nano: An EBSD Detector for High-Performance Entry into CMOS Technology
OmniProbe 400 Nanomanipulator

OmniProbe 400 Nanomanipulator
AZtecCrystal MapSweeper – harnessing the power of EBSD pattern matching technology for the semiconductor industry

AZtecCrystal MapSweeper – harnessing the power of EBSD pattern matching technology for the semiconductor industry
High temperature EDS analysis - enabling in situ heating for direct observation of phase transformations in the SEM

High temperature EDS analysis - enabling in situ heating for direct observation of phase transformations in the SEM

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