McCrone Associates, a company specializing in materials analysis, will be represented by its senior research scientists Elaine Schumacher and Craig Schwandt at this year’s Microscopy and Microanalysis Annual Meeting to be held in Phoenix. The scientists will be presenting new applications of Transmission Electron Microscopy (TEM) and Nanoscopy at the meeting.
Elaine Schumacher presentation is titled “Transmission Electron Microscopy for Characterization of Vial Glass Delamination Flakes.” It is to be held at the Phoenix Convention Center on August 1 at 11:30 a.m. Schumacher will discuss the advantages of employing TEM to isolated residues in liquid pharmaceutical products in order to detect and distinguish thin glass delamination flakes.
Schwandt’s presentation will offer a new approach to nanoscopy that makes it possible to utilize nanoanalysis and element mapping at nanometer scale to their fullest potential. Meaningful data interpretation at nanometer scale is limited by inability to fully quantify owing to unavailability of standard, homogenous reference materials of nanoscale. While the new generation of field emission scanning electron microscopes (FESEM) is capable of single nanometer resolution digital imaging, mathematical algorithms meant for quantifying material composition cannot be employed as they are suitable only for larger sample volumes. Schwandt therefore will demonstrate an alternative interpretation method to create an internally consistent calibration by employing element mapping with basic awareness of the material being studied. Schwandt’s presentation is scheduled to take place on August 2 at 4:15 p.m.