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Scientists Developed Process for Cleaning a Transmission Electron Microscope

A process for cleaning a transmission electron microscope without disassembling has been developed. Contaminants in the electron microscope are removed, and 100% performance is demonstrated. The accuracy and reliability of analyzing organic and polymeric materials at the nanometer level are improved.

5 Aug 2008

2008 Simon Memorial Prize Awarded to Key Members of NEC's Nano Electronics Research Lab

NEC Corporation announced today that Yasunobu Nakamura and Jaw-Shen Tsai, key members of NEC's Nano Electronics Research Laboratories, have been jointly awarded with the 2008 Simon Memorial Prize for their contributi...

5 Aug 2008

Study Answers Key Questions About Role of Particle Shape and Size in Nanomedicine

A team of researchers led by Joseph DeSimone, Ph.D., Chancellor's Eminent Professor of Chemistry in UNC's College of Arts and Sciences and William R. Kenan, Jr. Distinguished Professor of Chemical Engineering at North Carolina State University, and Stephanie Gratton, a graduate student in DeSimone's lab, have demonstrated that nanoparticles designed with a specific shape, size and surface chemistry are taken up into cells and behave differently within cells depending on these attributes.

5 Aug 2008

Eliminating Metal Nanoparticles Result in a More Corrosion-Resistant Alloy

Oxide scales are supposed to protect alloys from extensive corrosion, but scientists at U.S. Department of Energy's Argonne National Laboratory have discovered metal nanoparticle chinks in this armor. Oxide scales...

5 Aug 2008

UC Santa Barbara Professors to Lead Open Forum on Green Nanotechnology

UC Santa Barbara's Center for Nanotechnology in Society (CNS) and the California NanoSystems Institute (CNSI) invite the community to attend a casual public forum called "Nano-Meeter" to discuss the use and...

5 Aug 2008

ORION PLUS from Carl Zeiss Redefines What's Possible in High End Microscopy

At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Offering Additional Argon Ion Beam Column to NVison 40

To enable the production of highly polished TEM lamellas Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Showcases a New Class of SEM at Microscopy Exhibition

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Introduces Major Upgrade to LIBRA 120 EFTEM

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a major upgrade of its LIBRA® 120 Energy Filter Transmission Electron Microscope (EFTEM).

From Carl Zeiss Microscopy GmbH 5 Aug 2008

World's First All-Integrated Sensor Circuit Based on Nanowire Arrays

Scientists at the U.S. Department of Energy's Lawrence Berkeley National Laboratory and the University of California at Berkeley have created the world's first all-integrated sensor circuit based on nanowire arrays, combining light sensors and electronics made of different crystalline materials. Their method can be used to reproduce numerous such devices with high uniformity.

5 Aug 2008