Canada's National Institute for Nanotechnology (NINT) along with Hitachi High Technologies inaugurated the Hitachi Electron Microscopy Products Centre (HEMiC) on July 12, 2011.
A Hitachi H-95000 environmental transmission electron microscope (E-TEM) was also unveiled during the inauguration.
HEMiC will provide several electron microscopy services to academic and industrial customers and enable Hitachi researchers to develop innovative electron microscope equipment and methods by collaborating with NINT. The Centre will enable Hitachi to exhibit its latest microscopes, thus providing prospective customers from North America a chance to gain practical experience with new tools and methods prior to purchase.
The HEMiC Electron Microscope Tool Set includes Transmission Electron Microscopes (TEM), Scanning Electron Microscopes (SEM) and Focused Ion Dual Beam (FIB-SEM) and a material science transmission electron microscope from NINT.
The Hitachi H-9500 environmental transmission electron microscope (ETEM) can be used to observe chemical reactions in gaseous and liquid samples. It provides an extremely low background pressure which delivers minimal impact of background gases on the experiment and low contamination rate in samples. It is capable of heating the sample to 1500° C or above and being exposed to many gases or observes liquid samples at 300° C or above. The device can analyze chemicals using energy dispersive X-ray spectrometry and electron energy loss spectroscopy. This device allows users to study morphology and sample structure with diffraction and TEM imaging capabilities.
The Hitachi HF 3300 material science TEM is a cutting-edge device built with a post-column Gatan Tridiem Image Filter (GIF). The device utilizes a cold field emission gun technology to render high performance along with exceptional electron interferometry capabilities. The device is flexible and stable, both electrically and mechanically, to enable researchers to study complex samples and issues.
The Hitachi S-5500 offers a 1.6nm resolution at 1kV and 0.4nm resolution at 30kV. It renders high-performance to study morphology at the atomic or molecular level for various materials. The Duo-STEM Detector provides flexible collection angle and simultaneous imaging.
The Hitachi NB5000 integrates the abilities of a focused ion beam (FIB) column and a high resolution, field emission, scanning electron microscope (SEM) in one device. It can be used to observe 3D structural and chemical data at a sub-10 nm scale. It can be utilized to prototype several sensors and nano- and micro-mechanical equipment. It can also be used to prepare site-specific samples for transmission electron microscopes.
Source: http://www.nint.ca/