The main challenges when analyzing nanostructures come down to your sensitivity and your accuracy. With nanostructures especially, you can be looking at trace amounts of material and you want to be able to capture what's truly there. If you're analyzing down to individual atoms, you want to make sure that you are fully capturing that single atom, of Sulfur, for example.
Using Thin Films for Solar Panels
By Liam Critchley
Characterizing 2D Materials with AFM-IR Spectroscopy
From Bruker Nano Surfaces
Creating More Reliable AFM Results with Intelligent Scantronic™ Software
From NT-MDT Spectrum Instruments
Characterizing Superconducting Tapes and Wires
From Oxford Instruments Nanoscience
Accurate Nanoparticle Size Distribution from SAXS Measurements
Performing In Situ EDS in the TEM
By Alina Shrourou
New Graphene-Titania Composite can Remove Pollutants from the Atmosphere
Grain Boundaries in Graphene Do Not Affect Spin Transport
Researchers Simulate Detailed Behavior of Electrons in Graphene Nanoribbons
Imaging Technique Gives Catalytic 2D Material Engineering a Better View
New Phenomenon in 2D Semiconductors Could Boost Efficiency of Future Solar Cells
High-Pressure Microfluidisation Enables Oil Droplets to Enter Inorganic Crystals
From Analytik Ltd
In this interview, AZoNano speaks to Frank Deppe, Junior Group Leader for Superconducting Quantum Circuits at the Walther-Meißner-Institut, about QMiCS and the work that it does.
An interview with Jennifer McConnell, Product Manager at Protochips about how TEM can be made more relevant for catalysis research.
Dr Sam Marks
Dr Sam Marks discusses the ability to study nanostructures in situ in the TEM with Oxford Instruments' silicon drift detectors.
This page details the capabilities of OkyayTech’s integrated ALD system; the Glovebox.
This angle-resolved photoemission spectroscopy system is cryogen-free and can be used in the sub-Kelvin range.
Find out how the TS-C30 active vibration isolation table delivers value for researchers.