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PANalytical Introduces New Version XRD Software For Analyzing Epitaxial Layers

Specialist XRD Software for Analysis of Semiconductor Epitaxial Layers

Malvern Instruments Help Develop Nanoparticle Formulations for Paints and Coatings

Malvern Instruments Help Develop Nanoparticle Formulations for Paints and Coatings

Unique Quantum Effect Found in Silicon Nanocrystals

E M Optomechanical Announces Introduction of 3D MEMS Optical Profiler for Microsystems Training

Rigaku NANOHUNTER Wins 2007 R and D 100 Award

Rigaku NANOHUNTER Wins 2007 R and D 100 Award

Magnetic Tape Analysis 'Sees' Tampering in Detail

SUSS MicroTec Launches the iVista High-Resolution Digital Microscope

FEI Releases microValidator(TM) Software for SEMs and EDS

Carl Zeiss SMT Ships World’s First ORION™ Helium Ion Microscope to U.S. National Institute of Standards and Technology

Carl Zeiss SMT Ships World’s First ORION™ Helium Ion Microscope to U.S. National Institute of Standards and Technology

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