The Merger of Bruker and Veeco AFM and Optical Metrology Businesses
Frank Laukien, President and CEO of Bruker Corporation welcomes the Veeco Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM)
instruments to the Bruker family. Mark Munch, President of the Bruker Nano Surfaces Business also speaks of how the Veeco products, staff and clients will benefit from the new organization and resources.
Run Time - 3:32