Recent Advances in AFM-Based Nanoscale Thermal Analysis
This exclusive video features a presentation about the latest advances in atomic force microscopy (AFM)-based nanoscale thermal analysis. Quantitative nanoscale property information of polymer-based samples with statistically meaningful sampling can be provided using the AFM.
This webinar will present examples where new automatic transition temperature microscopy from Bruker AXS reveals nanoscale spatial variation in thermal properties.
Run Time – 53:52min