Posted in | Atomic Force Microscopes | Nanoanalysis | Nanomaterials

An Interview with Dr Mark Munch - Leading the Way for the AFM Industry

Dr Mark Munch, President of Bruker Nano Surfaces, talks to Will Soutter about the challenges and opportunities for AFM research at the Seeing at the Nanoscale event in Bristol.

Run time - 7:14 min

Interview with Dr Mark Munch, President of Bruker Nano Surfaces

Other Videos by this Supplier

The Bruker Innova-IRIS AFM-Raman System

The Bruker Innova-IRIS AFM-Raman System
The Dimension Fastscan from Bruker - The Fastest AFM on the Market

The Dimension Fastscan from Bruker - The Fastest AFM on the Market
Recent Advances in AFM-Based Nanoscale Thermal Analysis

Recent Advances in AFM-Based Nanoscale Thermal Analysis
Optical Profiler - The ContourGT-X8 from Bruker

Optical Profiler - The ContourGT-X8 from Bruker
High Speed AFM Performance on Three Qualification Samples

High Speed AFM Performance on Three Qualification Samples
Advances and Applications in Electrochemical AFM

Advances and Applications in Electrochemical AFM
Recent Advances in AFM for Microbiological Research

Recent Advances in AFM for Microbiological Research
Atomic Force Microscopy and Raman Spectroscopy Applications

Atomic Force Microscopy and Raman Spectroscopy Applications
ScanAsyst AFM Imaging Mode from Bruker AXS

ScanAsyst AFM Imaging Mode from Bruker AXS
Ultrahigh Resolution Imaging and Mechanical Mapping of Bacteriorhodopsin

Ultrahigh Resolution Imaging and Mechanical Mapping of Bacteriorhodopsin
DNA Image at 1 F/S with Dimension FastScan

DNA Image at 1 F/S with Dimension FastScan
Scan of Diffraction Grating with Dimension FastScan

Scan of Diffraction Grating with Dimension FastScan
Scan of Celgard with Dimension FastScan

Scan of Celgard with Dimension FastScan
Dimension FastScan with ScanAsyst AFM Imaging Mode

Dimension FastScan with ScanAsyst AFM Imaging Mode
Scan of Polysilicon with Dimension FastScan

Scan of Polysilicon with Dimension FastScan
ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker

ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker
Basic Setup and Applications of ISO and ASME Filtering Methods

Basic Setup and Applications of ISO and ASME Filtering Methods
Scratch Tests on Coatings

Scratch Tests on Coatings
Bruker AFM Probes

Bruker AFM Probes
Fast and Accurate Surface Metrology with 3D Microscopes

Fast and Accurate Surface Metrology with 3D Microscopes
ContourGT-K 3D Optical Microscope from Bruker

ContourGT-K 3D Optical Microscope from Bruker
BioScope Catalyst AFM with Inverted Optical Microscope for Life Sciences Applications from Bruker

BioScope Catalyst AFM with Inverted Optical Microscope for Life Sciences Applications from Bruker
Peak Force Tapping Mode on the Multimode 8 AFM from Bruker Nano Surfaces

Peak Force Tapping Mode on the Multimode 8 AFM from Bruker Nano Surfaces
Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces

Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces
Innova-IRIS AFM-Raman System from Bruker Nano Surfaces

Innova-IRIS AFM-Raman System from Bruker Nano Surfaces
Possible AFM Modes and Their Nanomedicine Applications

Possible AFM Modes and Their Nanomedicine Applications
Time-Lapse AFM Images of DPPC/DOPC Lipid Bilayers

Time-Lapse AFM Images of DPPC/DOPC Lipid Bilayers
Time Series of CM15 Antimicrobial Activity on Live E. coli Cells

Time Series of CM15 Antimicrobial Activity on Live E. coli Cells
Dynamics of CM15 Antimicrobial Activity on Outer Membrane of E. coli Cells

Dynamics of CM15 Antimicrobial Activity on Outer Membrane of E. coli Cells
Consecutive Images of Lipid Bilayer at 0.5 f/s

Consecutive Images of Lipid Bilayer at 0.5 f/s
Typical Topographic Images of DPPC/DOPC Lipid bilayer

Typical Topographic Images of DPPC/DOPC Lipid bilayer
Bruker Nano Surfaces Customer Care Centre - Interview with John L. Trahan

Bruker Nano Surfaces Customer Care Centre - Interview with John L. Trahan
Bruker Nano Surfaces European Applications Centre - Interview with Jim Flach

Bruker Nano Surfaces European Applications Centre - Interview with Jim Flach
Bruker Nano Surfaces European Applications Centre - Interview with Klaus Pross

Bruker Nano Surfaces European Applications Centre - Interview with Klaus Pross
Bruker Nano Surfaces Customer Care Centre - Interview with Venkata Reddy Mukku

Bruker Nano Surfaces Customer Care Centre - Interview with Venkata Reddy Mukku
AZo2Bruker - Grand Opening of Bruker Nano Surfaces Customer Facilities

AZo2Bruker - Grand Opening of Bruker Nano Surfaces Customer Facilities
Studying Mechanics of Soft Materials with AFM

Studying Mechanics of Soft Materials with AFM
Bruker's Dimension FastScan AFM at Nanoscale 2012

Bruker's Dimension FastScan AFM at Nanoscale 2012
Bruker's Innova-IRIS AFM-Raman Solution at Nanoscale 2012

Bruker's Innova-IRIS AFM-Raman Solution at Nanoscale 2012
C2C12 Stem Cell Migration on Glass Surface

C2C12 Stem Cell Migration on Glass Surface
Metrology for Semiconductor Process Control from Bruker Nano

Metrology for Semiconductor Process Control from Bruker Nano
Basics of Tribology from Bruker

Basics of Tribology from Bruker
Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker

Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker
Determination of Modulus of Elasticity for Soft Materials using AFM from Bruker

Determination of Modulus of Elasticity for Soft Materials using AFM from Bruker
Introduction of Dimension FastScan at Nanoscale 2012

Introduction of Dimension FastScan at Nanoscale 2012
Introduction of Innova IRIS at Nanoscale 2012 from Bruker

Introduction of Innova IRIS at Nanoscale 2012 from Bruker
Characterization of Stem Cell Flattening using Dimension FastScan AFM from Bruker

Characterization of Stem Cell Flattening using Dimension FastScan AFM from Bruker
Universal Materials Tester (UMT) from Bruker at MRS 2012

Universal Materials Tester (UMT) from Bruker at MRS 2012
Dimension FastScan Bio Atomic Force Microscope from Bruker at MRS 2012

Dimension FastScan Bio Atomic Force Microscope from Bruker at MRS 2012
ContourGT-I 3D Optical Microscope from Bruker at MRS 2012

ContourGT-I 3D Optical Microscope from Bruker at MRS 2012
TERS Probes for Tip Enhanced Raman Spectroscopy from Bruker at MRS 2012

TERS Probes for Tip Enhanced Raman Spectroscopy from Bruker at MRS 2012
Interview with Xiaomei Li on Latest Product Range from Bruker at MRS 2012

Interview with Xiaomei Li on Latest Product Range from Bruker at MRS 2012
PeakForce Tapping Mode in AFM instrumentation on DNA from Bruker

PeakForce Tapping Mode in AFM instrumentation on DNA from Bruker
Capturing Biological Dynamics with FastScan Bio from Bruker

Capturing Biological Dynamics with FastScan Bio from Bruker
'The Complete Tribology Lab' - The New UMT from Bruker

'The Complete Tribology Lab' - The New UMT from Bruker

AFM-Raman Solutions from Bruker Nano

AFM-Raman Solutions from Bruker Nano
Tribology and Mechanical Testing Workshop at the University of Sheffield from Bruker Nano Surfaces

Tribology and Mechanical Testing Workshop at the University of Sheffield from Bruker Nano Surfaces
Atomic Force Microscopy and Its Working Principle from Bruker

Atomic Force Microscopy and Its Working Principle from Bruker
AFM Probes from Bruker

AFM Probes from Bruker
Opterra Multipoint Scanning Confocal Microscope from Bruker for Biology Applications

Opterra Multipoint Scanning Confocal Microscope from Bruker for Biology Applications

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
(Logout)
Your comment type
Submit

Nanotechnology Videos by Subject Matter

Trending Stories

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback