Posted in | Nanoanalysis

JPK NanoWizard AFM - Tip Scanner vs. Sample Scanner

This video shows the benefits of the NanoWizard®II atomic force microscope (AFM) from JPK Instruments. The tip-scanning AFM such as the NanoWizard® I, II or III both enables simultaneous AFM and optical microscopy measurements.

Run Time – 2:15min

Atomic Force Microscopy - JPK NanoWizard® AFM - tip scanner vs. sample scanner

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