JPK NanoWizard AFM - Tip Scanner vs. Sample Scanner
This video shows the benefits of the NanoWizard®II atomic force microscope (AFM) from JPK Instruments. The tip-scanning AFM such as the NanoWizard® I, II or III both enables simultaneous AFM and optical microscopy measurements.
Run Time – 2:15min
Atomic Force Microscopy - JPK NanoWizard® AFM - tip scanner vs. sample scanner