Posted in | Atomic Force Microscopes | Nanoanalysis

Typical Topographic Images of DPPC/DOPC Lipid bilayer

This video shows the typical topographic images of DPPC/DOPC (dipalmitoylphosphatidylcholine/dioleoylphosphatidylcholine) supported lipid bilayers.

The height images (image size = 3µm; z-scale = 3.2nm) of DPPC/DOPC (1:1) lipid bilayers were recorded at 0.16 f/s using Bruker Nano Surfaces’ Dimension FastScan Bio AFM (atomic force microscopy) and TappingMode. The successive images reveal the stability of the bilayers under aqueous conditions.

Run Time – 0:07sec

Other Videos by this Supplier

The Bruker Innova-IRIS AFM-Raman System

The Bruker Innova-IRIS AFM-Raman System
The Dimension Fastscan from Bruker - The Fastest AFM on the Market

The Dimension Fastscan from Bruker - The Fastest AFM on the Market
Recent Advances in AFM-Based Nanoscale Thermal Analysis

Recent Advances in AFM-Based Nanoscale Thermal Analysis
Optical Profiler - The ContourGT-X8 from Bruker

Optical Profiler - The ContourGT-X8 from Bruker
High Speed AFM Performance on Three Qualification Samples

High Speed AFM Performance on Three Qualification Samples
Advances and Applications in Electrochemical AFM

Advances and Applications in Electrochemical AFM
Recent Advances in AFM for Microbiological Research

Recent Advances in AFM for Microbiological Research
Atomic Force Microscopy and Raman Spectroscopy Applications

Atomic Force Microscopy and Raman Spectroscopy Applications
ScanAsyst AFM Imaging Mode from Bruker AXS

ScanAsyst AFM Imaging Mode from Bruker AXS
Ultrahigh Resolution Imaging and Mechanical Mapping of Bacteriorhodopsin

Ultrahigh Resolution Imaging and Mechanical Mapping of Bacteriorhodopsin
DNA Image at 1 F/S with Dimension FastScan

DNA Image at 1 F/S with Dimension FastScan
Scan of Diffraction Grating with Dimension FastScan

Scan of Diffraction Grating with Dimension FastScan
Scan of Celgard with Dimension FastScan

Scan of Celgard with Dimension FastScan

Dimension FastScan with ScanAsyst AFM Imaging Mode

Dimension FastScan with ScanAsyst AFM Imaging Mode
Scan of Polysilicon with Dimension FastScan

Scan of Polysilicon with Dimension FastScan
ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker

ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker
Basic Setup and Applications of ISO and ASME Filtering Methods

Basic Setup and Applications of ISO and ASME Filtering Methods
Scratch Tests on Coatings

Scratch Tests on Coatings
Bruker AFM Probes

Bruker AFM Probes
Fast and Accurate Surface Metrology with 3D Microscopes

Fast and Accurate Surface Metrology with 3D Microscopes
ContourGT-K 3D Optical Microscope from Bruker

ContourGT-K 3D Optical Microscope from Bruker

BioScope Catalyst AFM with Inverted Optical Microscope for Life Sciences Applications from Bruker

BioScope Catalyst AFM with Inverted Optical Microscope for Life Sciences Applications from Bruker
Peak Force Tapping Mode on the Multimode 8 AFM from Bruker Nano Surfaces

Peak Force Tapping Mode on the Multimode 8 AFM from Bruker Nano Surfaces
Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces

Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces
Innova-IRIS AFM-Raman System from Bruker Nano Surfaces

Innova-IRIS AFM-Raman System from Bruker Nano Surfaces

An Interview with Dr Mark Munch - Leading the Way for the AFM Industry

An Interview with Dr Mark Munch - Leading the Way for the AFM Industry
Possible AFM Modes and Their Nanomedicine Applications

Possible AFM Modes and Their Nanomedicine Applications
Time-Lapse AFM Images of DPPC/DOPC Lipid Bilayers

Time-Lapse AFM Images of DPPC/DOPC Lipid Bilayers

Time Series of CM15 Antimicrobial Activity on Live E. coli Cells

Time Series of CM15 Antimicrobial Activity on Live E. coli Cells
Dynamics of CM15 Antimicrobial Activity on Outer Membrane of E. coli Cells

Dynamics of CM15 Antimicrobial Activity on Outer Membrane of E. coli Cells
Consecutive Images of Lipid Bilayer at 0.5 f/s

Consecutive Images of Lipid Bilayer at 0.5 f/s
Bruker Nano Surfaces Customer Care Centre - Interview with John L. Trahan

Bruker Nano Surfaces Customer Care Centre - Interview with John L. Trahan
Bruker Nano Surfaces European Applications Centre - Interview with Jim Flach

Bruker Nano Surfaces European Applications Centre - Interview with Jim Flach
Bruker Nano Surfaces European Applications Centre - Interview with Klaus Pross

Bruker Nano Surfaces European Applications Centre - Interview with Klaus Pross
Bruker Nano Surfaces Customer Care Centre - Interview with Venkata Reddy Mukku

Bruker Nano Surfaces Customer Care Centre - Interview with Venkata Reddy Mukku
AZo2Bruker - Grand Opening of Bruker Nano Surfaces Customer Facilities

AZo2Bruker - Grand Opening of Bruker Nano Surfaces Customer Facilities
Studying Mechanics of Soft Materials with AFM

Studying Mechanics of Soft Materials with AFM
Bruker's Dimension FastScan AFM at Nanoscale 2012

Bruker's Dimension FastScan AFM at Nanoscale 2012
Bruker's Innova-IRIS AFM-Raman Solution at Nanoscale 2012

Bruker's Innova-IRIS AFM-Raman Solution at Nanoscale 2012
C2C12 Stem Cell Migration on Glass Surface

C2C12 Stem Cell Migration on Glass Surface

Metrology for Semiconductor Process Control from Bruker Nano

Metrology for Semiconductor Process Control from Bruker Nano
Basics of Tribology from Bruker

Basics of Tribology from Bruker
Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker

Enhancement of Traditional Electron Microscopy Applications with AFM from Bruker
Determination of Modulus of Elasticity for Soft Materials using AFM from Bruker

Determination of Modulus of Elasticity for Soft Materials using AFM from Bruker
Introduction of Dimension FastScan at Nanoscale 2012

Introduction of Dimension FastScan at Nanoscale 2012
Introduction of Innova IRIS at Nanoscale 2012 from Bruker

Introduction of Innova IRIS at Nanoscale 2012 from Bruker
Characterization of Stem Cell Flattening using Dimension FastScan AFM from Bruker

Characterization of Stem Cell Flattening using Dimension FastScan AFM from Bruker
Universal Materials Tester (UMT) from Bruker at MRS 2012

Universal Materials Tester (UMT) from Bruker at MRS 2012
Dimension FastScan Bio Atomic Force Microscope from Bruker at MRS 2012

Dimension FastScan Bio Atomic Force Microscope from Bruker at MRS 2012
ContourGT-I 3D Optical Microscope from Bruker at MRS 2012

ContourGT-I 3D Optical Microscope from Bruker at MRS 2012
TERS Probes for Tip Enhanced Raman Spectroscopy from Bruker at MRS 2012

TERS Probes for Tip Enhanced Raman Spectroscopy from Bruker at MRS 2012
Interview with Xiaomei Li on Latest Product Range from Bruker at MRS 2012

Interview with Xiaomei Li on Latest Product Range from Bruker at MRS 2012
PeakForce Tapping Mode in AFM instrumentation on DNA from Bruker

PeakForce Tapping Mode in AFM instrumentation on DNA from Bruker
Capturing Biological Dynamics with FastScan Bio from Bruker

Capturing Biological Dynamics with FastScan Bio from Bruker
'The Complete Tribology Lab' - The New UMT from Bruker

'The Complete Tribology Lab' - The New UMT from Bruker

AFM-Raman Solutions from Bruker Nano

AFM-Raman Solutions from Bruker Nano
Atomic Force Microscopy and Its Working Principle from Bruker

Atomic Force Microscopy and Its Working Principle from Bruker
AFM Probes from Bruker

AFM Probes from Bruker
Opterra Multipoint Scanning Confocal Microscope from Bruker for Biology Applications

Opterra Multipoint Scanning Confocal Microscope from Bruker for Biology Applications

More Videos

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
(Logout)
Submit

Nanotechnology Videos by Subject Matter

Performing In Situ EDS in the TEM

Dr Sam Marks discusses the ability to study nanostructures in situ in the TEM with Oxford Instruments' silicon drift detectors.

Performing In Situ EDS in the TEM