Posted in | Nanoanalysis

Bruker's Dimension FastScan AFM at Nanoscale 2012

In this video, Samual Lesko, European Applications Lab Manager at Bruker Nano Surfaces, illustrates the ultimate performance of the Dimension FastScan atomic force microscope (AFM) at Nanoscale 2012 conference.

Run Time – 3:18min

AFM | Dimension FastScan Introduction at Seeing at the Nanoscale | Bruker

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