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Applied SEMVision G4 Defect Analysis Platform Honored with Prestigious Editors' Choice Best Product Award By SI Magazine

Applied Materials, Inc. today announced that its Applied SEMVision™ G4 Defect Analysis platform has been honored with the prestigious Editors' Choice Best Product Award by Semiconductor International (SI) magazine.

From Applied Materials Inc. 15 Jul 2009

Inexpensive and Portable Sensors Capable of Detecting Harmful Substances

FUJIFILM Dimatix today announced that a research team at McMaster University in Hamilton, Ontario, working with Canada's SENTINEL Bioactive Paper Network, has used its DMP-2800 Dimatix Materials Printer to develop a ...

15 Jul 2009

Global Industry and Market Analysis of Fuel Cells, Hydrogen Energy and Related Nanotechnology

Nanotechnologies will provide the technological keys that enable fuel cells and hydrogen as a fuel to become competitive and commonplace. iRAP has published a new directory with profiles over 800 companies and institutions in fuel cells, hydrogen energy and related nanotechnologies.

15 Jul 2009

Magma Announces Availability of Integrated Low-Power IC Implementation Reference Flow for UMC's Advanced 40-nm Process

Magma(r) Design Automation Inc. (Nasdaq:LAVA), a provider of chip design software, today announced the availability of an integrated low-power IC implementation reference flow for UMC's (NYSE:UMC) (TSE:2303) advanced...

15 Jul 2009

Three NIST Scientists Wins PECASE Award

Three scientists at the National Institute of Standards and Technology (NIST) have won Presidential Early Career Awards for Scientists and Engineers (PECASE), the nation's highest honor recognizing extraordinary achievements of young professionals at the outset of their independent research careers.

15 Jul 2009

SVTC Technologies Renews and Expands Partnership with Roth + Rau

Responding to emerging opportunities in the U.S. solar market as well as economic stimulus funding, SVTC Technologies and Roth + Rau have renewed and expanded their partnership and are establishing a 30 megawatt (MW) wor...

15 Jul 2009

EMC3D Consortium Extends Goals and Program to July 2011

Members of the international EMC3D semiconductor equipment and materials consortium today announced they will extend the life of the joint agreement to July 2011 from an original closing date of October 2009.

15 Jul 2009

Electrovaya to Participate in Number of Battery and Technology Conferences

Electrovaya Inc. (TSX:EFL) will be participating and presenting at a number of conferences and trade shows over the next few weeks. They include: 1. Infocast's Storage Week conference, in La Jolla, California from...

15 Jul 2009

New Grants Seek to Power the Future of Global Electronics with Nanoelectronics

Semiconductor Research Corporation (SRC), the world's leading university-research consortium for semiconductors and related technologies, today teamed with the National Science Foundation (NSF) to announce funding of $2 million in new supplemental grants for nanoelectronics research.

15 Jul 2009

New Study on Worldwide Nanotechnology Mid Infrared IR Sensor Markets

Research and Markets, the leading source for international market research and market data, has announced announce a new study on Worldwide nanotechnology mid infrared IR sensor markets. Worldwide mid IR sensors are pois...

From Research and Markets 15 Jul 2009

Cabot Epic D100 CMP Receives SI Magazine's "Editors' Choice Best Products" Award For 2009

Cabot Microelectronics Corporation (Nasdaq:CCMP), the world's leading supplier of chemical mechanical planarization (CMP) polishing slurries and growing CMP pad supplier to the semiconductor industry, announced today...

From Cabot Corporation 15 Jul 2009

In Tune Enables Researchers to Perform Novel Fluorescence Measurements for the First Time

The explosion in the number of new fluorescent dyes has opened up exciting new opportunities for life science researchers. However, each requires the microscope system to be equipped with an appropriate excitation laser, a limitation that has greatly restricted their adoption.

From Carl Zeiss Microscopy GmbH 15 Jul 2009

Nanotechnology News

Applied SEMVision G4 Defect Analysis Platform Honored with Prestigious Editors' Choice Best Product Award By SI Magazine

Inexpensive and Portable Sensors Capable of Detecting Harmful Substances

Global Industry and Market Analysis of Fuel Cells, Hydrogen Energy and Related Nanotechnology

Magma Announces Availability of Integrated Low-Power IC Implementation Reference Flow for UMC's Advanced 40-nm Process

Three NIST Scientists Wins PECASE Award

SVTC Technologies Renews and Expands Partnership with Roth + Rau

EMC3D Consortium Extends Goals and Program to July 2011

Electrovaya to Participate in Number of Battery and Technology Conferences

New Grants Seek to Power the Future of Global Electronics with Nanoelectronics

New Study on Worldwide Nanotechnology Mid Infrared IR Sensor Markets

Cabot Epic D100 CMP Receives SI Magazine's "Editors' Choice Best Products" Award For 2009

In Tune Enables Researchers to Perform Novel Fluorescence Measurements for the First Time

TSMC Announced Collaboration with NetLogic Microsystems

Kopin Uses LayTec EpiTT System for Temperature and Reflectance Monitoring of HBT epi Wafer Production

Complex, Large-Scale Design is Fully Implemented in Five Weeks

News Categories

Novel 3D Imaging Technique Captures In Situ Nanoparticle Self-Assembly

Nanoparticles That Boost Tomato Plant Growth

Research Boosts Graphene’s Potential to Unprecedented Heights

Covalent Organic Nanosheets Boost Sodium-Ion Battery Life

New Study Finds Electrons Flow Like Liquid in Graphene, Breaking Rules

Enhancing Slurry Stability in Lithium-Ion Batteries with Turbiscan Technology

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Sponsored Content

Comparing Spectroscopic Techniques for Nanoscale Analysis of Polyethylene Formation

How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors

Overcoming the Limits of Traditional DLS in Lipid-Based Nanoparticle Manufacturing

Next-Generation Biological Imaging Using Raman-SEM