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Veeco's InSight 3D Automated AFM Accepted by Key Global Semiconductor Customer

Veeco's InSight 3D Automated AFM Accepted by Key Global Semiconductor Customer

Using Nanoparticles to Deliver Treatments to Injured Brain and Spinal Cord Cells

New Thin Film Metrology Tools for MEMS to be Launched at Semicon Europa 2008

New Thin Film Metrology Tools for MEMS to be Launched at Semicon Europa 2008

CVD Equipment Corporation Announces $5.9 Million of New Orders

University of Nebraska-Lincoln Receives NSF Grant for Nanotechnology Research

University of Nebraska-Lincoln Receives NSF Grant for Nanotechnology Research

$250,000 Grant to Help Commercialize Enable IPC's Energy Efficient Technologies

SUSS MicroTec Launches Third Generation Manual Mask and Bond Aligner

KLA-Tencor Acquires Microelectronic Inspection Equipment of Vistec Semiconductor

KLA-Tencor Acquires Microelectronic Inspection Equipment of Vistec Semiconductor

New Platform Enables Rapid Cost-Effective Analysis of Entire Genomes

On-Demand Presentation and Application Note on SELS in Combination with GPC

Nanoscale Carbon Materials Researchers Presented with 2008 Julius Springer Prize for Applied Physics

Nanoscale Carbon Materials Researchers Presented with 2008 Julius Springer Prize for Applied Physics

Ecliptek MEMS Spread Spectrum Oscillators Greatly Reduce Cost and Lead Time

Ecliptek MEMS Spread Spectrum Oscillators Greatly Reduce Cost and Lead Time

STMicroelectronics Introduces First Automotive-Qualified Three-Axis MEMS Accelerometer

Scientists at RTI to Develop Next Generation of Thermoelectric Materials

SEMATECH Receives Best Paper Award for Work High-K Metal Gates

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