Posted in | MRS 2010 Fall Meeting Video Interviews | Nanoanalysis

The Contour GT Optical Profiler and AcuityXR Measurement Mode

Ross Smith from Bruker introduces us to the easy to operate Contour GT Optical/Surface Profilers. At the 2010 MRS Fall Meeting, where this interview was recorded, Bruker introduced AcuityXR which is a revolutionary new measurement mode from Bruker which combines both hardware and software to provide resolution beyond the diffraction limit, effectively allowing imaging of features down to 130nm.

Run Time - 3:08min

The ContourGT Optical Profilers from Bruker

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