Oxford Instruments Collaborates with CASMF Science and Technology Limited in China for Developing High Performance SPM Products From Oxford Instruments Nanoscience
Commercializing Graphene Dr. Zina Jarrahi Cinker Dr. Zina Jarrahi Cinker, Executive Director of the National Graphene Association (NGA), talks to AZoNano about the current state of the graphene market and how global standards can help sercure the materials future.
Pushing the Boundaries of TEM Research with the Poseidon Select Dr. Madeline J. Dukes DR. Madeline J. Dukes, an Application Scientist from Protochips talks to AZoNano about their range of products, that are pushing the boundaries for laboratories who in the past where challenged when it came to in situ TEM tools.
Supporting Scanning Electron Microscopes (SEMs) with the SEM-Base VI Wes Wigglesworth The SEM-BASE VI is the next generation active piezoelectric vibration cancellation product. Designed to support commercial scanning electron microscopes.
Next Generation STACIS Active Piezoelectric Vibration Cancellation - SEM-Base VI for SEMsSEM-Base® VI is considered to be the next generation in STACIS active piezoelectric vibration cancellation. The design of the SEM-Base VI allows it to support all commercial Scanning Electron Microscopes (SEMs), and also many Small Dual Beam and Focused Ion Beam (FIB) instruments. From Technical Manufacturing Corporation Vibration Control
eLINE Plus: Ultra High Resolution Electron Beam Lithography, Nanoengineering and ImagingThe eLINE Plus from Raith is the optimum, extensively distributed system for Research Centers and Universities that want to integrate an Electron Beam Lithography system with an open platform for additional optional nanofabrication processes and methods in a single tool. From Raith
Park NX-Bio AFM: Powerful Nanoscale Microscopy for Life ScienceA Life Scientist wants to be able to see how biological materials look like at nanoscale resolution and how soft they are in buffer and liquid conditions. The Park NX-Bio enables that with its highly acclaimed Atomic Force Microscopy (AFM) technology and its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM). From Park Systems Inc
