Hybrid pixel detectors improve dynamic range, speed, and sensitivity for a broad range of TEM applications From Dectris Ltd
Oxford Instruments Asylum Research Releases New White Paper: “Measuring Surface Roughness with the Jupiter XR Large-Sample Atomic Force Microscope” From Asylum Research - An Oxford Instruments Company
An Introduction to Quantum Microwaves for Communication and Sensing Frank Deppe In this interview, AZoNano speaks to Frank Deppe, Junior Group Leader for Superconducting Quantum Circuits at the Walther-Meißner-Institut, about QMiCS.
Making the TEM more Relevant for Catalysis Research Jennifer McConnell An interview with Jennifer McConnell, Product Manager at Protochips about how TEM can be made more relevant for catalysis research.
Performing In Situ EDS in the TEM Dr Sam Marks Dr Sam Marks discusses the ability to study nanostructures in situ in the TEM with Oxford Instruments' silicon drift detectors.
Spectroscopic Ellipsometer - SE-2000This page details information about the SE-2000, a spectroscopic ellipsometer with rotating compensator optics. From Semilab Semiconductor Physics Laboratory
ELMO - Glow Discharge System for EM Grids This page details the capabilities of ELMO, a glow discharge system for EM grids. From Cordouan Technologies
Polymer Imprinting Plates for Holoprint® ApplicationsPolymer imprinting plates can be used in the Holoprint® process for a long-time imprint performance. From Stensborg
3 Park Systems Announces $1 Million Dollar Nano Research Grant Fund for Researchers Setting up Nanoscience Labs in North America
Using AFM to Measure Surface Roughness From Asylum Research - An Oxford Instruments Company 26 Mar 2020