Mattson Technology, a provider of cutting-edge semiconductor processing equipment, has reported the shipment of its paradigmE etch system to a key chipmaker.
By Dr. Cameron Chai
16 Aug 2012
MEMS Industry Group (MIG), an association comprising 150 companies dealing in MEMS technology, will host the MEMS Executive Congress 2012 that brings together leaders from diverse industries to interact and exchange ideas about commercialization of MEMS.
By G.P. Thomas
16 Aug 2012
Physicists at the National Institute of Standards and Technology (NIST) have succeeded in achieving controlled acceleration of beryllium ions and bringing them to a stop in a timeframe of few microseconds.
Scientists from the Argonne National Laboratory’s Advanced Photon Source and Center for Nanoscale Materials have developed a new X-ray imaging technique that incorporates 3D visualization of a material’s surface without damaging the sample under study.
Are you interested in the latest research and developments in laboratory science? Visit Pittcon 2013.
Bruker today announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its industry leading Dimension Icon® platform.
A researcher from the University of Houston has developed a nanoparticle coating for solar panels that makes it easier to keep the panels clean, which helps maintain their efficiency and reduces the maintenance and operations costs.
Scientists at A*STAR’s Institute of Materials Research and Engineering (IMRE) have devised a ground-breaking technique that utilizes metal-laced nano-scale structures to create sharp, full-spectrum color images at 100,000 dpi, without using dyes or inks.
By G.P. Thomas
14 Aug 2012
ARM and GLOBALFOUNDRIES have inked a multi-year deal to jointly develop improved system-on-chip solutions to design ARM processors for GLOBALFOUNDRIES’ 20-nm and FinFET process technologies.
Bruker announced today the release of the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). PeakForce KPFM™ utilizes frequency-modulation detection to provide the highest spatial resolution Kelvin probe data.
Defect Structure in Nanomaterials from Woodhead Publishing covers a wide range of nanomaterials including metals; alloys; ceramics; diamond and carbon nanotubes and their composite.
Researchers at Massachusetts Institute of Technology have discovered that when placed over substrates of different materials, graphene’s basic properties such as chemical reactivity and electrical conductivity vary dramatically based on the characteristics of the underlying material.
Dr Keith McKenna, a physicist from the University of York, has played a major role in an intercontinental research, which contributed in establishing gold’s catalytic properties at a nano level. McKenna was part of a research team which found that the catalytic activity of nanoporous gold (NPG) starts from high amounts of surface defects that are present within its three-dimensional structure.
By Dr. Cameron Chai
13 Aug 2012
Carl Zeiss Microscopy revealed their High Definition Field Emission Scanning Electron Microscope (FE-SEM) SIGMA HD at the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona. SIGMA HD offers customers high resolution, fast imaging and easy sample navigation for nanoscale analytics in addition to the performance of the established SIGMA series.
Arkema, a major provider of multiwall carbon nanotubes, has announced that it will take part in NANO KOREA 2012, a key international exhibition dedicated to nanotechnologies. The exhibition will be conducted from August 16 to 18 at COEX, Seoul, Korea.