Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".
Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.
Image Metrology is a highly innovative company constantly developing new solutions meeting the demands from our high-tech customers. Image Metrology is supplying its products directly to the end users or via our distribution network, and having an export rate of 98%.
How to Use Void Material and Volume
Enhancing SPM and SEM Particle Size Analysis – The Improved SPIP 6.7
Advanced Fourier Analysis for Understanding Surface Structures and Distortions Using SPIP Software
Fast and Simple Processing and Reporting of Nanoscale Data Using SPIP Software
Advanced Analysis of Nanoscale Force Curves and Force Volume Images Using SPIP™ Software
Automatic and Rapid Particle and Pore Quantification Using SPIP Software
How to Accurately and Efficiently Process Information from Scanning Probe Microscopy
Precise and Rapid 3D Stitching of Topographical Images Using topoStitch Software
Advanced Microscopy, SPM, AFM and SEM Image Processing - SPIP™ Software
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
This product profile, provided by Merck, offers information regarding iron oxide magnetic nanoparticles.
The ClearView scintillator camera that elevates your everyday transmission electron microscopy (TEM).
Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.