Bruker’s M6 JETSTREAM Large Area Micro X-Ray Fluorescence Spectrometer

The Bruker M6 JETSTREAM has been developed for the non-destructive elemental analysis of large samples. The superior speed of the M6 JETSTREAM, which is based on high excitation intensity and detection effectiveness along with the fast stage allows short measurement times. The maximum stage speed is 100mm/s.

The spot size can be varied between 100 and 500µm, depending on the level of detail required in a measurement.

Key Features

The key features of the M6 JETSTREAM include:

  • Scanning of samples in vertical or horizontal position.
  • The instrument supports very quick measurement based on high excitation intensity and fast stage movement.
  • "On-the-fly" measurement enables even further acquisition time optimization.
  • Highest excitation efficiency with microfocus tube and polycapillary X-ray optics with variable spot size.
  • Bruker's sophisticated XFlash® silicon drift detectors (SDD) are used for detecting fluorescence radiation. They feature high count rate capability and energy resolution over a wide count rate range.
  • Special safety circuitry enables optimal user protection against exposure to X-rays.
  • Ultrasound distance measurement protects against collision with the measurement object.
  • Irrespective of sample size, the M6 JETSTREAM can be conveniently positioned due to its mobility.
  • Flexible acquisition for measuring single and multiple points and for distribution analysis in one or two dimensions - line scan and mapping - with flexible area size.
  • Distribution analysis with HyperMap, saving a complete spectrum for every pixel, offering a wide variety of options for data post processing

Key Applications

The key applications of the M6 JETSTREAM include:

  • Cultural heritage science - the ability to scan objects in-situ saves the user from having to transport - and possibly jeopardize - objects of immeasurable value.
  • Geoscience - supports the analysis of large drill core sections or other mineral samples.
  • Failure analysis - screening of big parts for flaws, inhomogeneities and other features of interest

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