Posted in | Nanoanalysis

The FEI Phenom Personal Electron Microscope Designed to Minimize Sample Charging

The FEI Phenom personal electron microscope has been designed to minimize the effects of sample charging in the electron microscope and produce optimal images from non-conductive samples. Reasons why charging occurs are outlined, as are techniques to avoid it.

Run time - 3:11 min

Sample Charging tips

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