Demonstration of MagicScan Technology by AIST-NT
Video demonstration of MagicScan Technology by AIST-NT.
AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode,
probe resonance frequency - 500 kHz, 30x30 microns scan area, 400x400 points.
Scan rate increases from 2 to 20 lines per second.
AIST-NT MagicScan technology demo, 30 microns
Run time: 3.34 mins