Posted in | Nanoanalysis

Demonstration of MagicScan Technology by AIST-NT - 12 Microns Scan Area

Video demonstration of MagicScan Technology by AIST-NT. AFM image of Test Grating (3 microns pitch, 25 nm height), semicontact AFM mode, probe resonance frequency - 500 kHz, 12?12 microns scan area, 300x300 points. Scan rate increases from 3 to 30 lines per second.

Run time: 3.04 mins

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