This video shows how LatticeGear's back side scriber is used to cleave a large sample from a silicon wafer. This sample preparation technique is useful for preparing samples for cross section analysis
Downsizing a Silicon (111) wafer with the FlipScribe
Cleaving Narrow Samples
Get to know LatticeGear
Do you have a review, update or anything you would like to add to this video content?
Cancel reply to comment
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
Dr. Yitong Dong
Dr. Yitong Dong has recently been awarded funding to study custom composite nanocrystals, which could help to create advanced quantum communication technologies. Learn more about this project in this interview.
Roey Elnathan, Ph.D.
We take a closer look at the fusion of nanotechnology and CAR-T therapy through our interview with Dr. Roey Elnathan about a new approach that harnesses the capabilities of nanoneedles to efficiently deliver genetic materials to target cells.
The Verifire™ interferometer system provides fast and reliable measurements of surface form error.
This article outlines how Unity, Oxford Instruments’ new detector for a revolutionary new imaging technique, can be used to revolutionize imaging.
Discover the compact, fast rotary table V-610 for precision testing and manufacture.