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Posted in | AFM Tips, Probes, Cantilevers

从应用的 NanoStructures 的平面的技巧 AFM 探测

从应用的 NanoStructures 的平面的技巧 AFM 探测
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应用的 NanoStructures’ FT 产品是有平台面的圆柱形过帐。 可以更改这个直径和高度符合这种应用。 过帐可能也合并到所有悬臂式设计里。 平台面可能用掀动报酬角度也做。 探测可以用于被分类的可变的应用或用金属涂为电子评定。

Last Update: 3. February 2012 16:17

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